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- 2024.01.23
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Updated Presentations(Sensor Technology: Presentations 1 case)
Sensor Technology
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- Presentations
- 2023/12
Toward the Practical Application of Terahertz Resonant Tunneling Diodes
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- 2023.12.11
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Updated Publications(Sensor Technology: Publications 1 case)
Sensor Technology
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- Publications
- 2023/10
Low-Power and Fast-Response Limiting Current-Type Oxygen Microsensor with a Wide Range Oxygen Concentration
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- 2023.11.09
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Updated Publications(Power Electronics: Publications 4 case)
Power Electronics
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- Publications
- 2023/10
Development of In-Situ Measurement Method for Wire-Bonding Lifetime Utilizing the 4-terminal Method - 2023/10
Comparison of Sintered Silver Die Attach Failure between Thermal Shock Test and Mechanical Cycling Test - 2023/10
Degradation Mechanism of Silver Sintering Die Attach Based on Thermal and Mechanical Reliability Testing - 2023/10
Nine Point Bending Test Technique for Understanding of Sintered Silver Die Bonding Failure Mechanism
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- 2023.09.26
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Updated Publications & Presentations (Power Electronics: Publications 1 case / Presentations 3 case)
Power Electronics
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- Publications
- 2023/09
The improved scheme of estimating embedded gate resistance to reproduce SiC MOSFET circuit performance
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- Presentations
- 2023/08
Development of a high-speed and high-accuracy SiC MOSFET model applicable to circuit and system simulators - 2023/09
Effect of the Forward and Reverse Conduction Resistance of SiC MOSFET on the Harmonic Voltage of the Full-Bridge Inverters of Wireless Power Systems for Electric Vehicles and Its Suppression Method - 2023/09
Sputtered β-Ga2O3 Crystallization by High Temperature Annealing on AlN/Si
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- 2023.08.09
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Updated Publications & Presentations (Power Electronics: Presentations 1 case)
Power Electronics
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- Presentations
- 2023/07
Application of remote epitaxy for SiC wafer cost reduction
- 2023.07.14
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Updated Publications & Presentations (Power Electronics: Presentations 1 case)
Power Electronics
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- Presentations
- 2023/06
Performance comparison between IGBT and SiC during WLTC
- 2023.06.15
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Power Electronics
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- Publications
- 2023/04
Performance Comparison of Si IGBT and SiC MOSFET Power Module driving IPMSM or IM under WLTC
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- Presentations
- 2023/05
Conducted noise evaluation of Dual-Half Bridge PFC converter
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Sensor Technology
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- Presentations
- 2023/05
Characteristic Improvement of MEMS-type Ultrasonic Device with Controllable Natural Frequencies
- 2023.04.14
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Power Electronics
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- Presentations
- 2023/05
Degradation Mechanism of Sintered Silver Die Attach by Thermal and Mechanical Cycling test - 2023/05
Simplified Open-Loop Transfer Functions to Analyze Influential Parasitic Parameters for Oscillation Caused by Parallel Connected Transistors - 2023/06
Suppression of Leakage Current in Wireless Charging Systems Using N-legged Inverters
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Sensor Technology
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- Presentations
- 2023/06
EXTREMELY SMALL LIMITING-CURRENT-TYPE OXYGEN SENSOR WITH A WIDE RANGE PROPORTIONALITY OF THE OXYGEN CONCENTRATION
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AI
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- Presentations
- 2023/03
Structural optimization of Toroidal Coils based on Neural Network and Explainable AI
- 2023.03.16
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Updated Publications & Presentations (AI: Presentations 2 cases)
AI
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- Presentations
- 2023/03
Population estimation of characteristic variation in power transistors - 2023/06
Positioning analysis of semconductor companies for specidfic technology using BERT
- 2023.02.14
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Power Electronics
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- Publications
- 2022/12
Dominant Model-Parameter Determination for the Analysis of Current Imbalance Across Paralleled Power Transistors
- Presentations
- 2023/03
Enhancement of linear-polarization degree of emitted beam from photonic-crystal surface-emitting lasers (PCSELs) - 2023/05
A Unified Model of MIS and Ridge HEMTs for Fast and High-Power Switching Applications.
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Sensor Technology
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- Presentations
- 2023/03
Tolerance of eigenfrequencies in the Su-Schrieffer-Heeger electrical circuit
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AI
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- Presentations
- 2023/03
Proposal for a market investigation method based on time series analysis of multiple information resources written in natural language.
- 2023.01.10
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Power Electronics
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- Presentations
- 2023/05
Autonomous Minimization of Power Loss by Switching Frequency Adjusting Function for a DC–DC Converter
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AI
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- Presentations
- 2022/12
Principal Component Analysis based GaN transistor live health monitoring
- 2022.12.27
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- NoMaDbot™ –No Map Driving Robot-
- 2022.12.12
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Updated Publications & Presentations (Power Electronics: Presentations 2 cases)
Power Electronics
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- Presentations
- 2022/12
A Secondary-Side Resonant LLC converter for Reducing Resonance Voltage with Boost Mode Operation Using Resonance Including Current Doubler Rectifier - 2022/12
Research on the correlation between power devices and power systems
- 2022.11.09
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Updated Publications & Presentations (Power Electronics: Presentations 3 cases)
Power Electronics
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- Presentations
- 2022/11
Nine Point Bending Test Technique for Evaluating the Sintered Silver Die Degradation - 2022/12
Sintered Silver Degradation Assessment by Thermal and Mechanical Cyclic Tests - 2023/01
SiC wafer cost reduction with remote epitaxy technology
- 2022.09.08
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Power Electronics
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- Presentations
- Sintered Silver Die Degradation Evaluation by Nine Point Bending Test Technique
- Control of current distribution for enhanced robustness of single-mode oscillation in a photonic-crystal surface-emitting laser
- Evaluating Sintered Silver Die-attach Thermal Cycling Degradation
- Degradation Mechanism Comparison of Sintered Silver Die in Thermal and Mechanical Cycling Tests
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Sensor Technology
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- Presentations
- THz imaging system with a single resonant tunneling diode transceiver in the 300-GHz band
- Size Reduction in Imaging System Using a Single Resonant Tunneling Diode Transceiver
- 2022.08.26
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Power Electronics
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- Publications
- Evaluation of Thermal Couple Impedance Model of Power Modules for Accurate Die Temperature Estimation up to 200℃
- An evaluation of a new type of High Efficiency Hybrid Gate Drive Circuit for SiC- MOSFET suitable for Automotive Power Electronics System Applications
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- Presentations
- Auto Structural Optimization of Toroidal Coils Based on Neural Network and Genetic Algorithm
- LPCVD SiN Film Breakdown and N2-anneal Temperature (Ⅰ) TDDB and ESR Evaluations
- LPCVD SiN Film Breakdown and N2-anneal Temperature (Ⅱ) ESR and FTIR Evaluations
- Effect of N2-Anneal Temperature on Silicon Nitride film:(Ⅰ) Time-Dependent Dielectric Breakdown and ESR Evaluations
- Effect of N2-Anneal Temperature on Silicon Nitride film:(Ⅱ) Fine Structures of ESR Spectrum and FTIR
- Effects of Underside-Si Annealing on Charge Breakdown of LPCVD SiN Film
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Sensor Technology
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- Presentations
- Oxygen and humidity sensing property of a limiting current-type thin-film YSZ-based sensor on a micro-hotplate
- Compact and cost-effective solution for terahertz applications