ML62Q1000 series (U16 Core)
The ML62Q1000 series has a wide lineup of ROM capacities and package sizes that take into account common designs and scalability for system optimization.
Therefore, even if the number of terminals and ROM capacity need to be changed, the software assets can be reused, making it ideal as a "platform" for model development.
* U16 Core : LAPIS Technology's original 16bit RISC CPU nX-U16/100 Core
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General-purpose 16bit MCUs
Fulfilling function,Operating frequency:Max 24MHz,Operating temperature -40°C to 105°C, safety functions
16bit ML62Q1000 series
- Feature 1: Multiple peripherals
A wide array of peripheral circuits are built-in, including numerous serial communication circuits, multifunction timers, a high accuracy analog function, and flash memory that supports background operation allows executing the program code while writing to the data flash.
- Feature 2: Broad lineup
The broad lineup includes several package types, from 16 to 64 pins, in program memory sizes ranging from 16KB to 64kB. Software-compatible peripheral functions are built in. The similar pin layouts enables flexible changes of package and/or program size.
- Feature 3: Safe operation
Some circuits are added to expand the self-test range. Also, the mcu provides functions that prevent crystal oscillation stop by pin leakages or malfunctions at power up and/or at low voltage.
Complete dual clock system drivers low power consumption
Complete Dual Clock System
Current Control at Powerup
Controlling the initial current at the power up and utilizing a low-speed clock as an initial clock minimizes the startup current, allows the operation with a current-limited power supply.
Feature 1Strong against noise and compatible with high temperatures
Cleared the highest class (±8kV)
during IEC61000-4-2 ESD noise testing (also cleared ±30kV)
Broad operating temperature range: -40°C to +105°C Compatible with high temperatures.
|Quality level||Testing voltage [kV]||ML62Q100 series|
Feature 2Enhanced safety functions
- Conventional safety functions
- RAM parity error
- RAM guard
- SFR guard
- Invalid memory access
- Oscillation frequency test
- A/D converter self-test
- NEW！Safety functions
- Flash memory CRC calculation
- GPIO self-test
- UART self-test
- SSIO self-test
- WDT test
- Clock backup
8 new functions have been added to the existing safety functions of 'Tough' MCUs (ML62013x series).
Feature 3Crystal oscillator strong against leakage (Less incidence of oscillation stop ! Safe in case it's stopped !)
Adopting a crystal oscillator circuit strong against leakage, prevents oscillator stop due to moisture adhesion. Also, the backup RC oscillator prevents system freeze even in case the oscillation happends to stop (48-pin to 100-pin products)
Feature 4Prevents malfunctions during power up (Prevents overcurrent, FET damage, and DAC noise)
The voltage detection reset function works at power up or at a low voltage to prevent problems caused by undefined or open output condition of ports.
High functionality, High performance and Low power tough MCU "ML62Q1000 series" which is built-in "U16 Core" can use it for the various uses such as consumer electronics, industrial equipment by taking over the noise resistance of "Tough" MCUs and adding to the enhanced safety functions.
Especially the safety functions realize not only fault diagnosis of peripheral equipment but self-diagnosis of MCUs. Therefore ML62Q1000 series are suitable for the high functional home appliance and compact appliance for kitchen.
ML62Q1000'ｓsafety functions (IEC/UL 60730 class B compliant)
One thing to pay special attention to in designing electrical home appliances is to prevent accidents in advance. Recently, microcontrollers are used for electric home appliances, and safety is secured by the function of microcontroller. Therefore, in order to avoid danger, the microcontroller itself needs a safety function to diagnose the failure of the microcontroller itself.
The ML62Q1000 series has many safety functions as hardware.
Safety functions built-in the ML62Q1000 series
|RAM guard||Prevent the miss-writing to the RAM|
|SFR guard||Prevent the miss-writing to the SFR|
|Successive approximation type A/D converter test||Successive approximation type AD converter test function|
|RAM parity error detection||Check RAM parity error and generates a reset on error (enable/disable reset by SFR, with reset status flag and parity error flag)|
|ROM unused area access reset||Generate a reset in case the CPU executes an instruction in the unused area (enable/disable reset by the code option, with reset status flag)|
|Clock mutual monitoring||Check whether the oscillation of the high-speed and low-speed clocks operates correctly|
|CRC calculation||Detect data error of flash memory and communications|
|UART self-test function||Check whether the UART works correctly|
|SSIO self-test function||Check whether the SSIO works correctly|
|I2C self-test function||Check whether the I2C wors correctly|
|WDT counter read||WDT counter read function|
|Port output level self-test function||General port self-test function|
|MCU status interrupt||Control interrupts generated by RAM parity error, automatic CRC calculation completion, data flash erase/program completion|
|Clock backup function and the self-test|
* ML62Q1400 / ML62Q1500 / ML62Q1600 / ML62Q1700
|Switch automatically to the low-speed RC oscillation in case the low-speed crystal oscillation stop|
The ML62Q1000 series can comply with international standard IEC / UL 60730 of automatic electric control device as self-diagnostic function software of microcontroller.
Self-diagnostic software compatible with IEC 60730-1 Annex H Software class B can be provided as sample software.
The functions supported by the ML62Q1000 series self-diagnostic software
|CPU||Register test||Detect stack fault in internal register of CPU|
|Detect stack fault in program counter|
|Interrupt||Interrupt test||Detect interrupt fault|
|Clock||Oscillation frequency test||Detect error by Measurement the frequency of the low-speed clock and the high-speed clock operating independently|
|Detect bit fault of program code area by CRC check|
|RAM test||Detect DC fault by RAM read / write test|
|Input / Output||GPIO test||Detects abnormality of output data by self-reading output data|
|A/D converter test||Detects abnormality of A/D converter and analog switch by A/D conversion of full scale / zero scale / internal reference voltage|
|UART / SSIO / I2C test||Detect abnormality of the communication circuit by internally connecting the transmission data and the reception data|
|Other||WDT test||Detect WDT counter error by reading WDT counter|
10 Years Longevity Program for Microcontrollers
The ML62Q1000 series is guaranteed for 10 years supply for industrial equipment.
*Please contact LAPIS Technology for more information.
Notes : Before using this program, please read and agree to the following terms.
- LAPIS Technology continues to supply the applicable products unless force majeure such as conflicts, natural disasters and accidents which inhibits LAPIS Technology from performing this program occurs. In an event of such situations, LAPIS Technology deliberate best possible solutions with you.
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- Production facilities, product specifications and materials are subject to change due to unavoidable circumstances.