I understand that a long soft start time period due to a large output capacitor value may result in startup failure, but can one perform calculations to determine whether startup failure will occur?|FAQ|ROHM Semiconductor

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I understand that a long soft start time period due to a large output capacitor value may result in startup failure, but can one perform calculations to determine whether startup failure will occur?
- Standard calculation methods are provided on the data sheets of ICs, and in essence, these should be used. In the end, actual equipment should be used to confirm operation and make judgments accordingly.